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Product

| Metrics ICV

Product

Software (S/W)

Metrics

Metrics ICV

| Fast and Easy Test Sequencing

• Wizard-based script editors enable you to quickly perform test sequencing without programming. Using the built-in editor you can select existing script functions and then copy, paste, re-arrange, and edit items for device connections, algorithm parameters, user-defined variable lists and global variables. Once you have saved your scripts then simply select them from the run-time parameters window.

| Complete Wafer Test Automation

• All popular semi-automatic and full automatic probers are supported by Metrics ICV prober tools. You can define the wafer, die, and sub-die information for probing across an entire wafer or a complete cassette of wafers on supported automatic wafer probers.

| Simple Workflow Based Interface

• Metrics ICV improves productivity and reduces the time to implement complex tests using point and click editors for setting up each aspect of the test.. This single unified environment allows for specifying everything from switch matrix device connections, module level actions, die navigation including sub-die definitions and wafer plan setup and execution.
• This workflow interface is separated into logical steps defining the sequence necessary to set up a device level or full wafer level test methodology. Perform system configuration and maintenance functions like backup and restore as well as launch other provided tools from the same common user interface.

| Operator Runtime Environment

• The interface allows simple run-time parameter setup and execution. Record all pertinent process information along with test conditions in the test data file.

| Start, Pause, Stop

• Test and monitor run-time status output that provides easy to understand information about the test in progress.

| Graphical Test Generation

• This integrated feature provides the utmost in flexibility for instrument control and requires no programming. Simply select the device type then point and click to set up your test. Save the settings and then you are ready to execute the tests across the wafer.

| Numerical Transform Editor

• Specify additional analysis functions using the built-in numerical transform editor to apply lists of equations to the measured data. Included are common numerical operators, line fitting, user-defined constants as well as other specialized functions specific to extracting parameters for semiconductor characteristics.

| Automatic Data Collection and Report Generation

• Metrics ICV has the ability to automatically export data in comma or tab-delimited ASCII format which can be easily imported into analysis tools such as Microsoft Excel, and other popular software packages such as spreadsheets, word processors, and databases. You can save data to any drive connected to the PC including shared volumes on the local area network. This allows you to view the test results on your desktop PC.

| Combine IV and CV Testing

• Using a switch matrix you can fully automate your IV and CV testing on wafer. Several supported CV instruments have special compensation algorithms provided for making accurate measurements through the high-frequency CV paths of the paired switch matrix.

• CV drivers provide support for standard cable length and phase shift compensation. Open, short and load calibration routines are also provided for achieving maximum accuracy.

| ICV Instrument Support

Model	Description
Agilent(HP) 4140B	pA Meter/DC Voltage Source
Agilent(HP) 4142B	Modular DC Source/Monitor
Agilent(HP) 4145A/B	Semiconductor Parameter Analyzer
Agilent(HP) 4155A/B/C	Semiconductor Parameter Analyzer
Agilent(HP) 4156A/B/C	Semiconductor Parameter Analyzer
Keysight E5270B	8-slot Precision Measurement Mainframe
Keysight 5272A	2-slot High Speed Source Monitor Unit
Keysight 5273A	2-slot High Speed Source Monitor Unit
Keysight E5260A	8-slot High Speed Measurement Mainframe
Keysight E5262A	2-slot High Speed Source Monitor Unit
Keysight E5263A	2-slot High Speed Source Monitor Unit
Keysight B1500A	Semiconductor Device Analyzer
Keysight B1505A	Power Device Analyzer/Curve Tracer
Keysight B2900A Serie	Precision Source/Measure Unit
Agilent(HP) 4275A	10 Hz-10 MHz Multi-frequency LCR Meter
Agilent(HP) 4280A	1 MHz C-Meter/CV Plotter
Agilent(HP) 4284A	20 Hz-1 MHz Precision LCR Meter
Agilent(HP) 4285A	75 Hz-30 MHz Precision LCR Meter
Agilent(HP) 4192A	Low Frequency Impedance Anaylzer
Keysight E4980A	20 Hz-2 MHz Precision LCR Meter

*When using more than one of these instruments together, you will need the 2361 TCU and all connectors
Keithley Model 236*	Source Measure Unit
Keithley Model 237*	High Voltage Source Measure Unit
Keithley Model 238*	High Voltage Source Measure Unit
Keithley 2400 Series*	Digital Source Meter
Keithley 6430*	Sub-fA Source Meter
Keithley 2600A Series	Digital Source Meter
Keithley 4200-SCS	Semiconductor Characterization System
Keithley Model 82	C-V Characterization System
Keithley Model 90	I-V Semiconductor Test System
Keithley Model 590	C-V Analyzer
Keithley Model 595	C-V Quasi-static CV Meter
QualiTau DSPT9012	Desktop Semiconductor Parametric Tester
Tektronix 370A/B	Curve Tracer
Tektronix 371A/B	High Power Curve Tracer

Switch Matrices
Model	Description
HP 4084A/4085A	Switch Matrix Controller and Matrix
Agilent(HP) E5250A	Low-Leakage Switch Mainframe
Agilent B2200A	fA Low-Leakage Switch Mainframe
Agilent B2201A	Low-Leakage Switch Mainframe
Keithley 706	Scanner Mainfram
Keithley 707	Switch Matrix Mainframe
Keithley 707A	Switch Matrix Mainframe
Keithley 708A	Single Slot Switch Mainframe
Keithley 7001	Switch Control Mainframe
Keithley 7002	Switch Control Mainframe