• Metrics Win4145TM provides new life for your HP4145A or HP4145B parameter analyzer. This product provides PC-based control of the instrument which results in data being collected directly to the computer. Data can be further analyzed using the built-in plotting and parameter extraction tools.
• Metrics Win4145 allows laboratories to extract additional useful life out of their equipment as well as streamline the effort required to transfer data to other PC-based tools or corporate data systems.
| Rapid Development
• Metrics Win4145 provides a point-and-click Windows interface for the rapid creation of tests.
• Win4145’s graphical tools allow for the complete replacement of front-panel control of the HP4145.
| Graphical Tools
• Metrics Win4145 includes plot tools for the visualization of measured data. Data can be grouped for presentation on the same axis. In addition graphical line-fit tools are provided for analysis of the data. The resulting plots can be printed or copied out to the Windows clipboard for movement into other applications.
| Numerical Transform Editor
• Specify additional analysis functions using the built-in numerical transform editor to apply lists of equations to the measured data. Included are common numerical operators, line fitting, user-defined constants as well as other specialized functions specific to extracting parameters for semiconductor characteristics.
| Test Sequence Execution
• Metrics Win4145 also contains a sequencing tool that allows a series of tests to be run automatically. This function when combined with the parameter extraction and plotting capability makes Win4145 a powerful tool for the collection and analysis of data using the HP4145.
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