제이스 측정솔루션 전문가 그룹, Battery Test System, Automotive Test System, Electric/Material Test System, Automated Test (ATE)

Product

| Metrics ICS

Product

Software (S/W)

Metrics

Metrics ICS

| Graphical Test Generation

• Built-in graphical test generation using the test setup editor provides full access to the supported instrument functionality and requires no programming. Simply select the device type then point and click to set up your test. Save the settings and then you are ready to execute the tests.

| Numerical Transform Editor

• Specify additional analysis functions using the built-in numerical transform editor to apply lists of equations to the measured data. Included are common numerical operators, line fitting, user-defined constants as well as other pecialized functions specific to extracting parameters for semiconductor characteristics.

| Fast and Easy Test Sequencing

• Metrics ICS provides a simple way to perform test sequencing without programming. Using the built-in sequence editor you can select existing test setups and then re-arrange the order of defined tests. Once you have saved your project then simply select the sequence measure tool from the measure toolbar to run all the selected tests.

| Automatic Data Collection and Report Generation

• Metrics ICS has the ability to automatically synchronize data in real-time with Microsoft Excel. Create user-defined macros in Excel to create automated reports. You can also export comma or tab-delimited ASCII data to be used in other popular software packages such as spreadsheets, word processors, and databases. You can save data to any drive connected to the PC including shared volumes on the local area network.

| Perform IV and CV Testing

• You can perform both IV and CV testing with Metrics ICS. Several supported CV instruments have special compensation algorithms to provide support for standard cable length and phase shift comp

| ICS Instrument Support

The following is a list of all of the instruments supported by Metrics ICS.
Please visit our website for detailed information and application notes.

Model	Description
Agilent(HP) 4140B	pA Meter/DC Voltage Source
Agilent(HP) 4142B	Modular DC Source/Monitor
Agilent(HP) 4145A/B	Semiconductor Parameter Analyzer
Agilent(HP) 4155A/B/C	Semiconductor Parameter Analyzer
Agilent(HP) 4156A/B/C	Semiconductor Parameter Analyzer
Keysight E5270B	8-slot Precision Measurement Mainframe
Keysight 5272A	2-slot High Speed Source Monitor Unit
Keysight 5273A	2-slot High Speed Source Monitor Unit
Keysight E5260A	8-slot High Speed Measurement Mainframe
Keysight E5262A	2-slot High Speed Source Monitor Unit
Keysight E5263A	2-slot High Speed Source Monitor Unit
Keysight B1500A	Semiconductor Device Analyzer
Keysight B1505A	Power Device Analyzer/Curve Tracer
Keysight B2900A Serie	Precision Source/Measure Unit
Agilent(HP) 4275A	10 Hz-10 MHz Multi-frequency LCR Meter
Agilent(HP) 4280A	1 MHz C-Meter/CV Plotter
Agilent(HP) 4284A	20 Hz-1 MHz Precision LCR Meter
Agilent(HP) 4285A	75 Hz-30 MHz Precision LCR Meter
Agilent(HP) 4192A	Low Frequency Impedance Anaylzer
Keysight E4980A	20 Hz-2 MHz Precision LCR Meter

*When using more than one of these instruments together, you will need the 2361 TCU and all connectors
Keithley Model 236*	Source Measure Unit
Keithley Model 237*	High Voltage Source Measure Unit
Keithley Model 238*	High Voltage Source Measure Unit
Keithley 2400 Series*	Digital Source Meter
Keithley 6430*	Sub-fA Source Meter
Keithley 2600A Series	Digital Source Meter
Keithley 4200-SCS	Semiconductor Characterization System
Keithley Model 82	C-V Characterization System
Keithley Model 90	I-V Semiconductor Test System
Keithley Model 590	C-V Analyzer
Keithley Model 595	C-V Quasi-static CV Meter
QualiTau DSPT9012	Desktop Semiconductor Parametric Tester
Tektronix 370A/B	Curve Tracer
Tektronix 371A/B	High Power Curve Tracer