SOLUTION
배터리 검사 분야
(Battery Test)
자동차 관련 검사 분야 (Automotive Test)
전기/소재 특성 측정 분야 (Electric/Material Test)
측정자동화
(ATE)
PRODUCT
SYSTEM
Battery Test System
Automotive Test System
Electric/Material Test System
Automated Test (ATE)
H/W
RF Switch System
Probe Station
Inter Connection
- Giga-probe(DVT)
- Adaptor/Connector/Cable
Jig & Test Fixture
S/W
J-Link 측정자동화 프로그램
- J-Link Studio
- J-Link Dielectric(유전율)
- J-Link LCR
- J-Link DMM
- J-Link PS
- J-Link Customized
Metrics
PORTFOLIO
개발이력
TECHNOLOGIES
특허
소프트웨어 저작권
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INQUIRY
견적문의
기술상담
기타문의
공지사항
JAYS PROFILE
회사 개요
사업분야 및 주요업무
조직도
오시는 길
Quick Menu
Product
SYSTEM
Hardware (H/W)
RF Switch System
• J-Link JSS 스위치 시스템
• Switching Solutions Bitifeye
Probe Station
• J-Link JPB Series
• Wentworth(프로브스테이션)
- S200FA & S300FA
- S200FA-HV
- M200FA & M300FA
- A200
- S200 & S300
- A200D
- S200D
- 사용자 주문형
- COMPASS
Inter Connection
• Giga-probe(DVT)
• J-Link JCO 커넥터
• J-Link JAD 어댑터
• J-Link JCA 케이블
Softdware (S/W)
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PEGASUS™ A200D
Product
Hardware (H/W)
Probe Station
Wentworth(프로브 스테이션)
PEGASUS™ A200D
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개요
• 자동 양면 프로브 스테이션 : 200 mm 웨이퍼용
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주요 기능
• Simultaneous, double-sided probing of wafers up to 200 mm (8″)
• Automatic handling, pattern recognition and probing
• High throughput cassette to cassette automation
• Customizable product enhancing hardware and software options
• Compatible with wide range of industry testers
• Configurable to high voltages in excess of 5 kV for specialized applications
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응용 분야
• Double-sided testing of discrete power semiconductors, metal-oxide semiconductor field-effect transistor (MOSFET) and insulated-gate bipolar transistor (IGBT) devices
• Testing of silicon based devices, newer wide-band gap (WBG) materials and compound semiconductors
• Test correlation
Product
Hardware (H/W)
Probe Station
Wentworth(프로브 스테이션)
PEGASUS™ A200D
